Optics: measuring and testing
By polarized light examination
Of surface reflection
Inventor
active
Buried strap poly etch back (BSPE) process
Collar formation by selective oxide deposition
Etch process for recessing polysilicon in trench structures
Integrated circuit trench device with a dielectric collar...
Integrated circuit vertical trench device and method of...
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Profile ID: LFUS-PAI-P-908225