4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Adnan A. Hamid

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Generating self-checking test cases from a reduced case...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Generating self-checking test cases from a reduced case...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for scenario search based random...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method and apparatus for the functional verification of digital

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent

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Method and apparatus for the functional verification of...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1615506

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