Generating self-checking test cases from a reduced case...

Details Generating self-checking test cases from a reduced case... Generating self-checking test cases from a reduced case...

2007-09-11

2010-12-07

Lin, Sun J (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07849425

ABSTRACT:
A method, system and apparatus for constructing a comprehensive test plan for a design under test (DUT) using a hierarchy of goals to generate test cases are provided. Embodiments of the present invention provide for automatically generating a first test case of the test plan from the goal hierarchy by traversing a path from a starting goal to an ending goal, wherein a first goal in the path has a first definition for one or more of a slot and a method. The ending goal of will then assume the first definition of the slot or method, as needed. A further aspect of the invention is generating a second test case by traversing a second path through the hierarchy. If the second path involves traversing a second goal with a second definition of the slot or method, then the ending goal will assume the second definition of the slot or method, as needed.

REFERENCES:
patent: 4716564 (1987-12-01), Hung et al.
patent: 5202889 (1993-04-01), Aharon et al.
patent: 5541849 (1996-07-01), Rostoker et al.
patent: 5724504 (1998-03-01), Aharon et al.
patent: 5995915 (1999-11-01), Reed et al.
patent: 6141630 (2000-10-01), McNamara et al.
patent: 6182258 (2001-01-01), Hollander
patent: 6195616 (2001-02-01), Reed et al.
patent: 6219809 (2001-04-01), Noy
patent: 6266787 (2001-07-01), McDermid et al.
patent: 6295517 (2001-09-01), Roy et al.
patent: 6347388 (2002-02-01), Hollander
patent: 6487704 (2002-11-01), McNamara et al.
patent: 6499132 (2002-12-01), Morley et al.
patent: 6502232 (2002-12-01), Campenhout
patent: 6519727 (2003-02-01), Noy
patent: 6526562 (2003-02-01), Haddad et al.
patent: 6530054 (2003-03-01), Hollander et al.
patent: 6647513 (2003-11-01), Hekmatpour
patent: 6675138 (2004-01-01), Hollander et al.
patent: 6684359 (2004-01-01), Noy
patent: 6687662 (2004-02-01), McNamara et al.
patent: 6698003 (2004-02-01), Baumgartner et al.
patent: 6968285 (2005-11-01), Hamid
patent: 2001/0010091 (2001-07-01), Noy
patent: 2002/0073375 (2002-06-01), Hollander
patent: 2003/0121011 (2003-06-01), Carter
patent: 2003/0188224 (2003-10-01), Decker
patent: 2004/0088677 (2004-05-01), Williams
patent: 2004/0133409 (2004-07-01), Mukherjee et al.
patent: 2005/0278702 (2005-12-01), Koyfman et al.
patent: 2006/0048026 (2006-03-01), Fine et al.
patent: 2006/0107141 (2006-05-01), Hekmatpour
patent: 2006/0107158 (2006-05-01), Mishra et al.
patent: 2006/0218512 (2006-09-01), Arslan et al.
patent: 2007/0011631 (2007-01-01), Fine et al.
patent: 2007/0168727 (2007-07-01), Fournier et al.
patent: 2008/0255813 (2008-10-01), Fine et al.
Mishra et al.; “Graph-based Functional Test Program Generation for Pipelined Processors”; 2004; IEEE; All Pages.
Fine et al.; “Coverage Directed Test Generation for Functional Verification using Bayesian Networks”; 2003; ACM; All Pages.
Calhoun et al.; “A Framework and Method for Hierarchical Test Generation”; IEEE Transactions on CAD, vol. 11, No. 1; Jan. 1992; pp. 45-67.
Lee et al.; “Hierarchical Test Generation Under Architectural Level Functional Constraints”; IEEE Transactions on CAD of ICs and Systems, vol. 15, No. 9; Sep. 1996; pp. 1144-1151.
DeMillo et al.; “Constraint-Based Automatic Test Data Generation”; IEEE Transactions on Software Engineering; Feb. 21, 1997; pp. 1-18.
“Structured Testing: A Testing Methodology Using the Cyclomatic Complexity Metric,” Arthur H. Watson et al., http://www.mccabe.com/pdf
ist235r.pdf, Computer Systems Laboratory, National Institute of Standard and Technology, Sep. 1996, pp. 1-124.

Affiliated with

Also associated with

Rating

Generating self-checking test cases from a reduced case... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Generating self-checking test cases from a reduced case..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Generating self-checking test cases from a reduced case... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4226053