Method and apparatus for scenario search based random...

Details Method and apparatus for scenario search based random... Method and apparatus for scenario search based random...

2005-11-22

2005-11-22

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S124000

Reexamination Certificate

active

06968285

ABSTRACT:
A method of describing a set of tests capable of being performed on a device under test (DUT) is disclosed. The method includes identifying a scenario space of the DUT.

REFERENCES:
patent: 4716564 (1987-12-01), Hung et al.
patent: 5202889 (1993-04-01), Aharon et al.
patent: 5724504 (1998-03-01), Aharon et al.
patent: 5995915 (1999-11-01), Reed et al.
patent: 6141630 (2000-10-01), McNamara et al.
patent: 6182258 (2001-01-01), Hollander
patent: 6195616 (2001-02-01), Reed et al.
patent: 6219809 (2001-04-01), Noy
patent: 6266787 (2001-07-01), McDermid et al.
patent: 6295517 (2001-09-01), Roy et al.
patent: 6347388 (2002-02-01), Hollander
patent: 6487704 (2002-11-01), McNamara et al.
patent: 6499132 (2002-12-01), Morley et al.
patent: 6502232 (2002-12-01), Campenhout
patent: 6519727 (2003-02-01), Noy
patent: 6526562 (2003-02-01), Haddad et al.
patent: 6530054 (2003-03-01), Hollander
patent: 6647513 (2003-11-01), Hekmatpour
patent: 6675138 (2004-01-01), Hollander et al.
patent: 6684359 (2004-01-01), Noy
patent: 6687662 (2004-02-01), McNamara et al.
patent: 6698003 (2004-02-01), Baumgartner et al.
patent: 2003/0188224 (2003-10-01), Decker
patent: 2004/0133409 (2004-07-01), Mukherjee et al.

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