Formation of metal gate electrode using rare earth alloy...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S287000, C438S587000

Reexamination Certificate

active

08058122

ABSTRACT:
Semiconductor devices and fabrication methods are provided, in which metal transistor gates are provided for MOS transistors. A rare earth-rare earth alloy incorporated metal nitride layer is formed above a gate dielectric. This process provides adjustment of the gate electrode work function, thereby tuning the threshold voltage of the resulting NMOS transistors.

REFERENCES:
patent: 6936508 (2005-08-01), Visokay et al.
patent: 2006/0234433 (2006-10-01), Luan et al.
patent: 2006/0244035 (2006-11-01), Bojarczuk et al.
patent: 2007/0148838 (2007-06-01), Doris et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Formation of metal gate electrode using rare earth alloy... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Formation of metal gate electrode using rare earth alloy..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Formation of metal gate electrode using rare earth alloy... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4312918

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.