Semiconductor device for testing semiconductor process and...

Details Semiconductor device for testing semiconductor process and... Semiconductor device for testing semiconductor process and...

2007-04-03

2009-10-13

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S733000, C714S734000, C714S736000, C714S742000, C714S745000, C700S108000, C438S014000, C702S182000, C257S048000, C324S500000, C324S765010

Reexamination Certificate

active

07603598

ABSTRACT:
A semiconductor device for testing a semiconductor process applied to manufacturing the semiconductor device is disclosed. The semiconductor device includes at least a testing group. The testing group includes a first testing block and a second testing block. The first testing block includes: a first input node; a first output node; a plurality of first selecting nodes; a first reference device, coupled to the first input node and the first output node; and a first target device, coupled to the first selecting nodes and the first output node. The second testing block includes: a second input node; a second output node; a plurality of second selecting nodes; a second reference device, coupled to the second input node and the second output node; and a second target device, coupled to the second selecting nodes and the second output node.

REFERENCES:
patent: 6756787 (2004-06-01), Ohlhoff et al.
patent: 7046026 (2006-05-01), Chao et al.
patent: 7446552 (2008-11-01), Cano et al.
patent: 2004/0257104 (2004-12-01), Fujinaga et al.
patent: 2005/0090922 (2005-04-01), Kinoshita
patent: 2008/0099762 (2008-05-01), Garcia et al.

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