4. Electronic digital logic circuitry
  5. With test facilitating feature

Chia-Nan Hong

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Integrated circuit chip with high area utilization rate

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Semiconductor device for testing semiconductor process and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2943738

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