Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-03-04
2009-02-17
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S245000, C257SE21653
Reexamination Certificate
active
07491603
ABSTRACT:
According to some embodiments of the invention, transistors of a semiconductor device have a channel region in a channel-portion hole. Methods include forming embodiments of the transistor having a channel-portion hole disposed in a semiconductor substrate. A channel-portion trench pad and a channel-portion layer are sequentially formed at a lower portion of the channel-portion hole. A word line insulating layer pattern and a word line pattern are sequentially stacked on the channel-portion layer and fill the channel-portion hole, disposed on the semiconductor substrate. The channel-portion layer is formed to contact the semiconductor substrate through a portion of sidewall of the channel-portion hole, and forms a channel region under the word line pattern. Punchthrough is prevented between electrode impurity regions corresponding to source and drain regions.
REFERENCES:
patent: 6355974 (2002-03-01), Lin et al.
patent: 6423618 (2002-07-01), Lin et al.
patent: 6787838 (2004-09-01), Chidambarrao et al.
patent: 10-032331 (1998-03-01), None
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patent: 1998-068340 (1998-10-01), None
patent: 1999-0049708 (1999-07-01), None
English language abstract of Japanese Publication No. 10-032331.
English language abstract of Korean Publication No. 1998-068340.
Lee Sang-Hyun
Seo Hyeoung-Won
Song Du-Heon
Ghyka Alexander G
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
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