Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-02-07
2008-09-30
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000, C716S030000
Reexamination Certificate
active
07430699
ABSTRACT:
An apparatus, program product and method utilize a clustering algorithm based upon trading propensity to generate assignments of circuit elements to clusters or groups to optimize a spatial distribution of the plurality of clusters. For example, trading propensity-based clustering may be used to assign circuit elements such as scan-enabled latches to individual scan chains to optimize the layout of the scan chains in a scan architecture for an integrated circuit design.
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Fredrickson Mark S.
McBride Chad B.
Ton David
Wood Herron & Evans
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