Test output compaction for responses with unknown values

Details Test output compaction for responses with unknown values Test output compaction for responses with unknown values

2007-12-25

2007-12-25

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S727000

Reexamination Certificate

active

11277782

ABSTRACT:
A spatial compactor design and technique for the compaction of test response data is herein disclosed which advantageously provides a scan-out response with multiple opportunities to be observed on different output channels in one to several scan-shift cycles.

REFERENCES:
patent: 5038349 (1991-08-01), Lipp
patent: 6829740 (2004-12-01), Rajski et al.
patent: 7032148 (2006-04-01), Wang et al.
patent: 7210083 (2007-04-01), Grinchuk et al.
patent: 7222277 (2007-05-01), Wang et al.
patent: 7239978 (2007-07-01), Cheng et al.

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