Algorithm to test LPAR I/O subsystem's adherence to LPAR I/O...

Details Algorithm to test LPAR I/O subsystem's adherence to LPAR I/O... Algorithm to test LPAR I/O subsystem's adherence to LPAR I/O...

2007-07-24

2007-07-24

Lamarre, Guy (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

C714S718000, C714S724000, C714S763000

Reexamination Certificate

active

10422652

ABSTRACT:
A system for testing logical partitioning. In a preferred embodiment, an I/O adapter is configured to break partitioning rules, for example, to attempt to access addresses outside a valid address range. Software is used to check for expected errors at expected addresses. If expected errors are not found, a fault in the partitioning I/O subsystem is indicated.

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patent: 2003-058383 (2003-02-01), None

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