4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

Shakti Kapoor

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Algorithm to test LPAR I/O subsystem's adherence to LPAR I/O...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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I/O stress test

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Light weight and high throughput test case generation...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Method and system for low level testing of central...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Method, system and computer program product to stress and...

Electrical computers and digital processing systems: memory – Storage accessing and control – Shared memory area
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2221747

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