Built-in-test diagnostic and maintenance support system and...

Details Built-in-test diagnostic and maintenance support system and... Built-in-test diagnostic and maintenance support system and...

2007-04-10

2007-04-10

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000

Reexamination Certificate

active

10874620

ABSTRACT:
A diagnostic and maintenance support system and process are provided for performing tests, collecting Built-In-Test (BIT) log data from systems, analyzing fault data, and recommending Shop Replaceable Units (SRU's). The system and process include uploading and reading a retrieved fault signature from a BIT log retrieved from a subject system under test. The retrieved fault signature is a serial word composed of a plurality of consecutive bits indicating either a pass or fail. Each bit is assigned to a specific SRU, system level test, or an event. The system and process further include a source code segment for performing a Discrete Fault Mask (DFM) algorithm, a Combinational Fault Mask (CFM) algorithm, and a source code segment for performing a Reserved Fault Mask (RFM) algorithm to identify a list of potentially problematic SRU's if matching bits are not found between the retrieved fault signature and the list of CFM serial words.

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patent: 7005873 (2006-02-01), Kim et al.

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