Semiconductor integrated circuit device equipped with read...

Details Semiconductor integrated circuit device equipped with read... Semiconductor integrated circuit device equipped with read...

2006-12-12

2006-12-12

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S744000

Reexamination Certificate

active

07149944

ABSTRACT:
A semiconductor integrated circuit device includes a semiconductor memory circuit device, a first sequencer, and a second sequencer. The semiconductor memory circuit device stores data. The first sequencer controls writing of data into the semiconductor memory circuit device. The second sequencer controls reading of data from the semiconductor memory circuit device.

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Nadeau-Dostie, B., “Design For AT-Speed Test, Diagnosis and Measurement”, Kluwer Academic Publishers, Chapter 2: pp. 35-57, (2000).

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