Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Reexamination Certificate
2006-01-10
2006-01-10
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Containers or enclosures
C356S445000
Reexamination Certificate
active
06985222
ABSTRACT:
A system and method for detecting chamber leakage by measuring the reflectivity of an oxidized thin film. In a preferred embodiment, a method of detecting leaks in a chamber includes providing a first monitor workpiece, placing the first monitor workpiece in the chamber, and forming at least one film on the first monitor workpiece. The reflectivity of the least one film of the first monitor workpiece is measured, wherein the reflectivity indicates whether there are leaks in the at least one seal of the chamber. In another embodiment, the method includes providing a second monitor workpiece, placing the second monitor workpiece in the chamber, and forming at least one film on the second monitor workpiece. The reflectivity of the at least one film of the second monitor workpiece is measured, and the second monitor workpiece film reflectivity is compared to the first monitor workpiece film reflectivity.
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Chen Chu-Chang
Cheng Hsi-Kuei
Feng Hsien-Ping
Wang Ting-Chun
Wang Ying-Lang
Rosenberger Richard A.
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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