4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Containers or enclosures

Chu-Chang Chen

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Chamber leakage detection by measurement of reflectivity of...

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for reducing defects in post passivation interconnect...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Chu-Chang Chen does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Chu-Chang Chen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chu-Chang Chen will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2918692

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure