Method of releasing devices from a substrate

Etching a substrate: processes – Etching of semiconductor material to produce an article...

Reexamination Certificate

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C216S011000, C216S079000, C438S719000, C438S733000, C438S739000

Reexamination Certificate

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06905616

ABSTRACT:
Micro devices are formed in situ in a high density in a substrate comprising a masked silicon layer over a stop layer of a silicon compound, by anisotropically etching the desired feature in the silicon layer, overetching to form a notch at the silicon-stop layer interface, depositing a protective fluorocarbon polymer layer on the sidewalls and bottom of the etched silicon layer, and isotropically etching to separate the etched feature from the stop layer. This method avoids the problems of stiction common in other methods of forming micro devices.

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