Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-04-26
2005-04-26
Blum, David S. (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S244000
Reexamination Certificate
active
06884673
ABSTRACT:
In some embodiments, an integrated circuit device includes a substrate and an interlevel-insulating layer on the substrate that has a hole therein that exposes the substrate. A unitary lower electrode of a capacitor is disposed on the substrate and has a contact plug portion thereof that is disposed in the hole. A dielectric layer is on the lower electrode and an upper electrode of the capacitor is on the dielectric layer. In other embodiments, an integrated circuit device includes a substrate and an interlevel-insulating layer on the substrate that has a hole therein that exposes the substrate. A barrier layer is disposed on the exposed portion of the substrate and on sidewalls of the interlevel-insulating layer. A contact plug is disposed in the hole on the barrier layer. A lower electrode of a capacitor is disposed on the contact plug and engages the contact plug at a boundary therebetween. A dielectric layer is on the lower electrode and an upper electrode of the capacitor is on the dielectric layer.
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Notice to Submit Response, Korean Application No. 10-2001-0030529, Feb. 27, 2003.
Jeong Yong-kuk
Joo Jae-hyun
Kim Wan-don
Yoo Cha-young
Blum David S.
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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