Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-04-12
2011-04-12
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S726000
Reexamination Certificate
active
07925947
ABSTRACT:
A method and apparatus for compacting test responses containing unknown (X) values in a scan-based integrated circuit using an X-canceling multiple-input signature register (MISR) to produce a known (non-X) signature. The known (non-X) signature is obtained by selectively exclusive-ORing (XORing) together combinations of MISR bits which are linearly dependent in terms of the unknown (X) values using a selective XOR network.
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Touba Nur A.
Wang Laung-Terng (L.-T.)
Bacon & Thomas PLLC
Kerveros James C
Syntest Technologies, Inc.
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