Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Corporate Assignee
active
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Computer-aided design (CAD) multiple-capture DFT system for...
Computer-aided design system to automate scan synthesis at...
Computer-aided design system to automate scan synthesis at...
IEEE Std. 1149.4 compatible analog BIST methodology
Mask network design for scan-based integrated circuits
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