Method for depositing ozone/TEOS silicon oxide films of reduced

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

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427255, 4272551, 4272552, 4272553, 4272557, 4274192, 427574, 427579, C23C 1600

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053567226

ABSTRACT:
A process for depositing void-free silicon oxide layers over stepped topography comprising depositing a first silicon oxide seed layer which is doped with nitrogen from a plasma of tetraethoxysilane and a nitrogen-containing gas, and depositing thereover a silicon oxide layer from a mixture of tetraethoxysilane, ozone and oxygen at low temperatures to produce a silicon oxide layer having improved properties.

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Fujino et al, J. Electrochem. Soc. vol. 138 No. 2 Feb. 1991 pp. 550-554.
Matsuura et al, Abs. 22nd Conf on Solid State Devices & Matls, 1990, pp. 187-193 no month available.
Fujino et al, Jun. 12-13, 1990 VMIC Conf. IEEE pp. 187-193.

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