Sidewall spacer for protecting tunnel oxide during isolation tre

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438257, 438229, 438304, 438367, H01L 21336

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active

059813415

ABSTRACT:
A method for making a self-aligned isolated flash memory core without damaging tunnel oxide layers between memory element stacks and the silicon substrate supporting the stacks includes depositing three sidewall layers on the stacks, prior to etching isolation trenches between the stacks, to thereby shield the tunnel oxide during isolation trench etching.

REFERENCES:
patent: 5024957 (1991-06-01), Harame et al.
patent: 5278438 (1994-01-01), Kim et al.
patent: 5391508 (1995-02-01), Matsuoka et al.
patent: 5409854 (1995-04-01), Bergemont
patent: 5420060 (1995-05-01), Gill et al.
patent: 5427968 (1995-06-01), Hong
patent: 5474947 (1995-12-01), Chang et al.
patent: 5478767 (1995-12-01), Hong
patent: 5494838 (1996-02-01), Chang et al.
patent: 5631179 (1997-05-01), Sung et al.
patent: 5661057 (1997-08-01), Fujiwara
patent: 5702965 (1997-12-01), Kim
A 0.67 um2 Self-Aligned Shallow Trench Isolation Cell (SA-STI Cell) For 3V-only 256Mbit NAND EEPROMS, pp. 3.6.1-3.6.4, International Electronic Devices Meeting, Sponsored by IEEE, 1994.

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