4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

Andrew S. Hildebrant

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Source synchronous timing extraction, cyclization and sampling

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Source synchronous timing extraction, cyclization and sampling

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Systems and methods for adaptively compressing test data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate

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Systems and methods for testing a device-under-test

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Verification of integrated circuit tests using test...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2275113

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