Tungsten tunnel-free process

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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Details

257763, 257774, 257764, 257700, 257750, 257758, 257734, 438653, 438654, 438656, H01L 2348, H01L 2352, H01L 2940

Patent

active

059329297

ABSTRACT:
An improved method of forming a tunnel-free tungsten plug is described. Semiconductor device structures are provided in and on a semiconductor substrate. An insulating layer of borophospho-tetraethoxysilane (BP-TEOS) is deposited overlying the semiconductor device structures. Contact openings are etched through the insulating layer to the underlying semiconductor device structures wherein a tunnel opens in the insulating layer between contact openings. The semiconductor substrate is covered with a first barrier metal layer. The semiconductor substrate is coated with a spin-on-glass layer wherein the contact openings and the tunnel are filled with the spin-on-glass. The spin-on-glass is anisotropically etched away whereby the spin-on-glass remains only within the tunnel. The semiconductor substrate is covered with a second barrier metal layer. The contact openings are filled with tungsten which is etched back to form tungsten plugs within the contact openings wherein the filled tunnel provides tunnel-free tungsten plugs in the fabrication of the integrated circuit device.

REFERENCES:
patent: 5296400 (1994-03-01), Park et al.
patent: 5340774 (1994-08-01), Yen
patent: 5364817 (1994-11-01), Lur et al.
patent: 5385858 (1995-01-01), Manabe
patent: 5644151 (1997-07-01), Izumi et al.

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