Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1998-01-05
2000-11-28
Trinh, Michael
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438138, 438268, 438269, H01L 21366
Patent
active
06153451&
ABSTRACT:
A method for increasing the operating voltage of a transistor formed on a substrate of a first conductivity region of a second conductivity type in a surface of the substrate. An N-well adjust region of the first conductivity type is then formed in the N-well region. The N-well adjust region extends to a first depth in the N-well region. A double diffusion well of the first conductivity type is then formed in the N-well. The double diffusion well extends to a second depth greater than the first depth of the N-well adjust region, and contains a portion of the N-well. Two N- channel stop regions are then formed in the N-well. The two N-channel stop regions extending to a third depth greater than the depth of the N-well adjust region, and contain a portion of the N-well.
REFERENCES:
patent: 4794432 (1988-12-01), Yilmaz et al.
patent: 5171699 (1992-12-01), Hutter et al.
patent: 5436179 (1995-07-01), Erdeljac et al.
patent: 5585294 (1996-12-01), Smayling et al.
patent: 5719421 (1998-02-01), Hutter et al.
patent: 5728593 (1998-03-01), Yun et al.
Erdeljac John P.
Hutter Louis N.
Smith Jeffrey P.
Brady III Wade James
Telecky Jr. Frederick J.
Texas Instruments Incorporated
Trinh Michael
LandOfFree
Transistor with increased operating voltage and method of fabric does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Transistor with increased operating voltage and method of fabric, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transistor with increased operating voltage and method of fabric will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1724451