Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2010-01-26
2011-12-27
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S288000, C438S719000, C257SE21409, C257SE29255
Reexamination Certificate
active
08084329
ABSTRACT:
In an embodiment, a method of fabricating a transistor device comprises: providing a semiconductor topography comprising a gate conductor disposed above a semiconductor substrate between a pair of dielectric spacers; anisotropically etching exposed regions of the semiconductor substrate on opposite sides of the dielectric spacers to form recessed regions in the substrate; oxidizing exposed surfaces of the substrate in the recessed regions to form an oxide thereon; removing the oxide from bottoms of the recessed regions while retaining the oxide upon sidewalls of the recessed regions; and isotropically etching the substrate such that the recessed regions undercut the pair of dielectric spacers.
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Arnold John C.
Hua Xuefeng
Jagannathan Rangarajan
Schmitz Stefan
Cantor & Colburn LLP
Ghyka Alexander
International Business Machines - Corporation
Petrokaitis Joseph
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