Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-09-05
2006-09-05
Gurley, Lynne A. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S261000, C438S287000, C438S768000, C438S782000, C438S785000
Reexamination Certificate
active
07101754
ABSTRACT:
A method of making a film with a high dielectric constant uses a spin-on sol-gel process to deposit the film on a substrate, the film having a composition (SiO2)x(TiO2)1−x, where 0.50<x<0.75. The resulting film is annealed in an oxygen-containing atmosphere at a temperature lying in the range of 500° C. to 700° C.
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Brassard, D. et al: High-k titanium silicate thin films grown by reactive magnetron sputtering for CMOS.
“Deposition of thick silica-titania sol-gel films on Si substrates”, R.R.A. Syms et al., Journal of Non-Crystalline Solids 170 (1994) London, UK, 1994 Elsevier Science B.V., XP-002361077, pp. 223-233.
Brassard Daniel
Dilip K. Sarkar
My Ali El Khakani
Ouellet Luc
DALSA Semiconductor Inc.
Gurley Lynne A.
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