Test system rider board utilized for automated at-speed...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S704000

Reexamination Certificate

active

06996757

ABSTRACT:
A test head performs at-speed testing of high serial pin count gigabit per second (GBPS) devices. The test head includes a device under test (DUT) coupled to a first portion of the test head and a rider board coupled to the DUT. The rider board includes a first signal path including switching matrices coupled to the DUT, a second signal path including bit error rate testing (BERT) engines, each of the BERT engines being coupled to each other, corresponding ones of the switching matrices, and to the DUT, and a third signal path including Ethernet testing circuits coupled to the DUT. The BERT engines allow for routing of a test signal from any of the switching matrices to any other switching matrix (e.g., between non-adjacent switching matrices).

REFERENCES:
patent: 5025205 (1991-06-01), Mydill et al.
patent: 5103169 (1992-04-01), Heaton et al.
patent: 5226048 (1993-07-01), Bandali et al.
patent: 5506510 (1996-04-01), Blumenau
patent: 5581177 (1996-12-01), Hussey et al.
patent: 5764069 (1998-06-01), Cugini
patent: 5900753 (1999-05-01), Cote et al.
patent: 6157185 (2000-12-01), Stone et al.
patent: 6519230 (2003-02-01), Murayama
patent: 6538420 (2003-03-01), Chen et al.
patent: 6539027 (2003-03-01), Cambron
patent: 6691269 (2004-02-01), Sunter
patent: 6853211 (2005-02-01), Doherty et al.
patent: 2002/0099513 (2002-07-01), Keezer
Search Report from European Patent Application No. 03008272.1, 4 pages (dated Feb. 23, 2004).
Keezer, D.C., et al., “Terabit-per-second Automated Digital Testing,”ITC International Test Conference, IEEE, pp. 1143-1151 (2001).
Keezer, D.C., “Multiplexing Test System Channels for Data Rates Above 1 Gb/s,”International Test Conference, IEEE, pp. 362-368 (1990).

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