Test system for circuits

Details Test system for circuits Test system for circuits

2006-08-22

2006-08-22

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

07096396

ABSTRACT:
A test system for circuits which is capable of selecting any one of a plurality of circuits to be tested and testing a selected circuit to be tested, includes a tested circuit data producing unit which produces tested circuit data concerning any one of several circuits to be tested; and a control unit which controls a plurality of programmable gate arrays (PGAs) on the basis of an output of the tested circuit data producing unit. Furthermore, the test system for circuits includes a plurality of PGAs each of which is connected to the control unit and generates a test pattern in response to control data sent from the control unit according to a program; and interface units which are associated with the plurality of PGAS, respectively, and are connected to the circuits to be tested.

REFERENCES:
patent: 4903267 (1990-02-01), Arai et al.
patent: 5963735 (1999-10-01), Sample et al.
patent: 6044481 (2000-03-01), Kornachuk et al.
patent: 6202182 (2001-03-01), Abramovici et al.
patent: 6400173 (2002-06-01), Shimizu et al.
patent: 6436741 (2002-08-01), Sato et al.
patent: 6628621 (2003-09-01), Appleton et al.
patent: 6853597 (2005-02-01), Jain
patent: 2002/0171449 (2002-11-01), Shimizu et al.
patent: 2004/0175850 (2004-09-01), Shimizu et al.
patent: 63-139266 (1988-06-01), None
patent: 6-180342 (1994-06-01), None
patent: 7-134160 (1995-05-01), None
patent: 10-96758 (1998-04-01), None
patent: 11-15740 (1999-01-01), None
patent: 2000-55990 (2000-02-01), None
patent: 2001-174522 (2001-06-01), None
patent: 2001-210685 (2001-08-01), None
Office Action for corresponding Japanese Application No. 2002-041163 mailed Sep. 21, 2004.
Final Office Action for corresponding Japanese Application No. 2002-041163 mailed Oct. 4, 2005.

Affiliated with

Also associated with

Rating

Test system for circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test system for circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test system for circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3647371