Test socket and method for producing known good dies using the t

Details Test socket and method for producing known good dies using the t Test socket and method for producing known good dies using the t

1996-05-09

1997-07-01

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102

Patent

active

056442475

ABSTRACT:
A test socket and a method for identifying a known good die using the test socket. The test socket includes a substrate having penetrating apertures, and land patterns formed around the penetrating apertures. The substrate has contact terminals at one side which are connected to the outside, and a protective casing is installed on the upper part of the substrate. After the semiconductor chips are mounted in the test socket by a piece of adhesive tape, to cover the penetrating apertures of the substrate, the bonding pads of the semiconductor chips and the land patterns of the substrate are connected to each other by wires. The test socket is then installed on a burn-in test board to carry out a burn-in test. The wires of the bare chips, which have been subjected to the burn-in test are cut by a cutting device, and a lower portion of each semiconductor chip corresponding to a known good die, is hit by an ejection pin through the penetrating apertures of the substrate to separate and obtain the known good dies. Accordingly, a plurality of known good dies may be obtained by carrying out one burn-in test.

REFERENCES:
patent: 5247248 (1993-09-01), Fukunaga
patent: 5367253 (1994-11-01), Wood
patent: 5378981 (1995-01-01), Higgins

Affiliated with

Also associated with

Rating

Test socket and method for producing known good dies using the t does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test socket and method for producing known good dies using the t, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test socket and method for producing known good dies using the t will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-600315