Test program debugger device, semiconductor test apparatus,...

Details Test program debugger device, semiconductor test apparatus,... Test program debugger device, semiconductor test apparatus,...

2007-09-11

2007-09-11

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S739000

Reexamination Certificate

active

11211162

ABSTRACT:
A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.

REFERENCES:
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 6167545 (2000-12-01), Statovici et al.
patent: 6434503 (2002-08-01), Sommer
patent: 6725449 (2004-04-01), Maeda et al.
patent: 7047463 (2006-05-01), Organ et al.

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