Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-26
2007-06-26
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S738000, C714S742000
Reexamination Certificate
active
10933690
ABSTRACT:
There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply and receive signals to/from the electronic device; a plurality of return circuits operable to receive fail timing signals indicating timing at which a fail occurs on output patterns output from the electronic device, the return circuits being provided corresponding to the plurality of test modules; a plurality of summarizing units operable to receive the fail timing signals output from the plurality of return circuits and compute logical sum of one or more fail timing signals among the plurality of fail timing signals to output one bit signal; and a plurality of distributing units operable to distribute the computed results of corresponding ones of the summarizing units to the plurality of test modules, the distributing units being provided corresponding to the plurality of summarizing units.
REFERENCES:
patent: 4359772 (1982-11-01), Patel
patent: 4928278 (1990-05-01), Otsuji et al.
patent: 5041912 (1991-08-01), Schlig et al.
patent: 5453945 (1995-09-01), Tucker et al.
patent: 5884236 (1999-03-01), Ito
patent: 6055644 (2000-04-01), Henkel et al.
patent: 6232945 (2001-05-01), Moriyama et al.
patent: 6539511 (2003-03-01), Hashizume
patent: 7024101 (2006-04-01), Takahashi et al.
patent: 2002/0049554 (2002-04-01), Miller
patent: 2005/0138505 (2005-06-01), Kanbayashi et al.
patent: 60-100064 (1985-06-01), None
patent: 06-051027 (1994-02-01), None
patent: 09167498 (1997-06-01), None
patent: 2003-156538 (2003-05-01), None
Patent Abstracts of Japan, publication No. 2003-156538, publication date May 30, 2003, 2 pages.
Patent Abstracts of Japan, publication No. 06-051027, publication date Feb. 25, 1994, 2 pages.
Patent Abstracts of Japan, publication No. 60-100064, publication date Jun. 3, 1985, 2 pages.
Supplemental European Search Report dated Sep. 1, 2006 issued in European Patent Application 04772609.6-2216, 3 pages.
Advantest Corporation
Gandhi Dipakkumar
Lamarre Guy
Osha & Liang LLP
LandOfFree
Test apparatus for testing an electronic device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test apparatus for testing an electronic device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus for testing an electronic device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3834937