Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2006-07-28

2008-08-05

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S736000

Reexamination Certificate

active

07409615

ABSTRACT:
A test apparatus for testing a device under test15is provided. The test apparatus includes a driver122for applying a test signal to the device under test, a comparator128for comparing a result signal outputted by the device under test15corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section110for setting the voltage of the test signal to a predetermined voltage value to cause the driver122to terminate the transmission path of the result signal when the test apparatus reads from the device under test15.

REFERENCES:
patent: 6445208 (2002-09-01), Sugamori
patent: 6859059 (2005-02-01), Rohrbaugh et al.
patent: 7023233 (2006-04-01), Furukawa
patent: 7298162 (2007-11-01), Furukawa
patent: 2006/0071682 (2006-04-01), Hashimoto
patent: 2002-139551 (2002-05-01), None
patent: 2003-279629 (2003-10-01), None
International Search Report issued in International application No. PCT/JP2005/000993 mailed on May 27, 2005, 2 pages.

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