4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Having specific delay in producing output waveform

Hirokatsu Niijima

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Jitter measuring apparatus and a testing apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se
Reexamination Certificate

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Jitter quantity calculator and tester

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Measuring apparatus, measuring method, and test apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor test device and timing measurement method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Temperature compensation circuit and method for providing a cons

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Having specific delay in producing output waveform
Patent

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Profile ID: LFUS-PAI-P-183938

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