Test apparatus and method for testing a circuit unit

Details Test apparatus and method for testing a circuit unit Test apparatus and method for testing a circuit unit

2006-02-17

2009-08-11

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000

Reexamination Certificate

active

07574643

ABSTRACT:
In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is connected to the circuit subunits by means of a connecting unit, test signals are generated for the electric circuit and response signals generated by the electric circuit in response to the test signals are evaluated. The test signals and the response signals are interchanged between the circuit subunits by means of at least one compression/decompression unit associated with at least one of the circuit subunits.

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