Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2006-07-25
2006-07-25
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S194000, C365S189070, C365S222000
Reexamination Certificate
active
07082070
ABSTRACT:
A temperature detection circuit and method are provided. The temperature detection circuit samples a first delay time for an input signal at a target temperature to be detected, stores a first addresses generated as the sampled result, samples a second delay time for the input address at a present operating temperature, compares a second addresses generated as the sampled result with the first addresses, and generates a detection signal if the target temperature to be detected is the same as the present operating temperature. The temperature detection method is performed by the temperature detection circuit.
REFERENCES:
patent: 5495452 (1996-02-01), Cha
patent: 5680359 (1997-10-01), Jeong
Dinh Son T.
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
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