Tap time division multiplexing

Details Tap time division multiplexing Tap time division multiplexing

2007-01-16

2007-01-16

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S701000

Reexamination Certificate

active

11015330

ABSTRACT:
An integrated circuit comprising (i) a plurality of portions, each portion including test control circuitry; and (ii) at least one test input arranged to receive test data, wherein the test data is clocked in a plurality of time slots, with test data for different ones of the plurality of portions being allocated to different time slots.

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patent: 5845059 (1998-12-01), McClure
patent: 6023778 (2000-02-01), Li
patent: 6347063 (2002-02-01), Dosaka et al.
patent: 2003/0101376 (2003-05-01), Sanghani

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