Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-02-16
2008-10-21
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S047300, C361S002000, C361S103000
Reexamination Certificate
active
07441173
ABSTRACT:
Certain exemplary embodiments comprise a system that comprises an application specific integrated circuit configured to provide an output signal. The output signal can be configured to trip a device in an electrical circuit responsive to a detected fault. The application specific integrated circuit can comprise a temperature sensor. The application specific integrated circuit can be configured to correct at least one measured electrical value responsive to a temperature measured by the temperature sensor.
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Restrepo Carlos
Zhang Bin
Siemens Energy & Automation Inc.
Ton David
LandOfFree
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