Systems and methods for testing integrated circuits

Details Systems and methods for testing integrated circuits Systems and methods for testing integrated circuits

2006-04-18

2006-04-18

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S727000, C714S741000

Reexamination Certificate

active

07032151

ABSTRACT:
Systems and methods for digital-based, standards-compatible, testing of analog circuits embedded inside integrated circuits. In this regard, one such system can be broadly described by a test stimulus generator that transmits a binary-level test-stimulus signal into an analog circuit located inside an integrated circuit; a converter that converts an analog output signal from the analog circuit into a digital output signal; a boundary-scan register chain that transmits the digital output signal out of the integrated circuit, and a test equipment that receives the digital output signal using the IEEE 1149.1 boundary-scan standard and analyzes the digital output signal to compute one or more specifications of the analog circuit located inside the integrated circuit.

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Dr. R. G. “Ben” Bennetts, “Tech Note: Boundary-Scan Testing, Part 1: An Introduction,”Copyright 1999 ChipCenter, pp. 1-3, http://www.chipcenter.com/TestandMeasurement/tn037.html?PRINT=true.
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Rick Nelson, “Implement Analog PCB Tests Pending IEEE 1149.4's Emergence,” Mar. 2, 2000, pp. 1-4, http://www.tmworld.com/articles/2000/03—PCB.htm.

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