Systems and methods for facilitating testing of pad drivers...

Details Systems and methods for facilitating testing of pad drivers... Systems and methods for facilitating testing of pad drivers...

2006-01-10

2006-01-10

Lamarre, Guy (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S763010, C324S765010

Reexamination Certificate

active

06986085

ABSTRACT:
Integrated circuits (ICs) are provided. A representative IC includes a first pad electrically communicating with at least a portion of the IC. The first pad includes a first driver and a first receiver, with the first driver being configured to provide a first pad output signal to a component external to the IC, and the first receiver being configured to receive a first pad input signal from a component external to the IC. The first receiver also is configured to provide, to a component internal to the IC, a first receiver digital output signal in response to the first pad input signal. A first test circuit also is provided that is internal to the IC. The first test circuit is adapted to provide information corresponding to the driver tristate leakage current of the first pad. Methods, computer-readable media, systems and other ICs also are provided.

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Haulin, Tord, “Built-in Parametric Test for Controlled Impedance I/Os,” Ericsson Telecom, S-126 25 Stockholm, Sweden, pp. 123-128, Apr. 27-May 1, 1997.

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