Systems and methods for circuit testing using LBIST

Details Systems and methods for circuit testing using LBIST Systems and methods for circuit testing using LBIST

2004-10-08

2009-12-01

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S724000, C714S726000, C714S727000, C714S728000, C714S729000, C714S734000, C714S736000, C714S738000, C714S739000

Reexamination Certificate

active

07627798

ABSTRACT:
Systems and methods for performing logic built-in-self-tests (LBISTS) in digital circuits. In one embodiment, the operation of LBIST circuitry is suspended at the end of each test cycle so that the bit patterns generated by the functional logic of the device under test can be examined to determine if any errors occurred during the test cycle. Pseudorandom bit patterns are scanned into the scan chains interposed between portions of the functional logic circuit and then propagated through the functional logic. The resulting bit patterns are captured in scan chains following the functional logic and then scanned out of the scan chains. The bit patterns are processed and compared to corresponding data generated by a parallel LBIST system in a device that is known to operate properly. The LBIST test cycles are then halted if there are errors in the generated bit patterns or resumed if there are no errors.

REFERENCES:
patent: 4097797 (1978-06-01), Finet
patent: 4304001 (1981-12-01), Cope
patent: 4654850 (1987-03-01), Rodrigues et al.
patent: 4680760 (1987-07-01), Giles et al.
patent: 5103450 (1992-04-01), Whetsel
patent: 5233610 (1993-08-01), Nakayama et al.
patent: 5396595 (1995-03-01), Standley
patent: 5541940 (1996-07-01), Akita
patent: 5983380 (1999-11-01), Motika et al.
patent: 6145105 (2000-11-01), Nadeau-Dostie et al.
patent: 6324485 (2001-11-01), Ellis
patent: 6407567 (2002-06-01), Etter
patent: 6480979 (2002-11-01), Tomari
patent: 6505313 (2003-01-01), Phan et al.
patent: 6559671 (2003-05-01), Miller et al.
patent: 6609222 (2003-08-01), Gupta et al.
patent: 6742149 (2004-05-01), Osawa
patent: 6760873 (2004-07-01), Hao et al.
patent: 6966021 (2005-11-01), Rajski et al.
patent: 6971054 (2005-11-01), Kurtulik et al.
patent: 7055077 (2006-05-01), Kiryu et al.
patent: 7085980 (2006-08-01), Martin-de-Nicolas et al.
patent: 7099783 (2006-08-01), Hasegawa et al.
patent: 2001/0054166 (2001-12-01), Fukuda
patent: 2002/0125907 (2002-09-01), Kurtulik et al.
patent: 2002/0138801 (2002-09-01), Wang et al.
patent: 2002/0138802 (2002-09-01), Firth et al.
patent: 2002/0184560 (2002-12-01), Wang et al.
patent: 2003/0009714 (2003-01-01), Evans
patent: 2003/0149925 (2003-08-01), Angelotti et al.
patent: 2003/0188243 (2003-10-01), Rajan
patent: 2003/0212940 (2003-11-01), Wong
patent: 2003/0229886 (2003-12-01), Hasegawa et al.
patent: 2003/0237025 (2003-12-01), Song
patent: 2005/0028058 (2005-02-01), Perner
patent: 2005/0081130 (2005-04-01), Rinderknecht et al.
patent: 2005/0120284 (2005-06-01), Ouellette et al.
patent: 2005/0138509 (2005-06-01), Kiryu et al.
patent: 2005/0251716 (2005-11-01), Degrenand
patent: 2006/0080585 (2006-04-01), Kiryu

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