Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-09-27
2005-09-27
Auduong, Gene (Department: 2818)
Static information storage and retrieval
Read/write circuit
Testing
C365S154000
Reexamination Certificate
active
06950355
ABSTRACT:
A method for testing a semiconductor wafer. An array of probes is coupled to the semiconductor wafer. Then a voltage difference is applied across a plurality of adjacent metal line pairs (e.g., wordline and/or bitline pairs) of one or more SRAM arrays of at least one die. Application of the voltage difference induces failure of metal stringers or defects between the adjacent lines. Additionally, the voltage can be applied across respective pairs of substantially all parallel metal lines of the one or more SRAM arrays of more that one die of the semiconductor wafer.
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Battacharya Surya
Chen Henry
Chen Ming
Shiau Guang-Jye
Tsau Liming
Auduong Gene
Broadcom Corporation
Sterne Kessler Goldstein & Fox p.l.l.c.
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