Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-11-20
2007-11-20
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10908803
ABSTRACT:
Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
REFERENCES:
patent: 5353235 (1994-10-01), Do et al.
patent: 5883564 (1999-03-01), Partin
patent: 6441319 (2002-08-01), Handforth et al.
patent: 6532581 (2003-03-01), Toyonaga et al.
patent: 6587991 (2003-07-01), Mbouombouo et al.
patent: 6618846 (2003-09-01), Cheng
patent: 6662250 (2003-12-01), Peterson
patent: 6732338 (2004-05-01), Crouse et al.
patent: 2001/0047508 (2001-11-01), Miura et al.
patent: 2002/0184601 (2002-12-01), Fitzhenry et al.
patent: 2003/0023937 (2003-01-01), McManus et al.
patent: 2003/0088845 (2003-05-01), Teig et al.
patent: 2003/0172358 (2003-09-01), Alon et al.
patent: 2003/0182643 (2003-09-01), Crouse et al.
patent: 2003/0200513 (2003-10-01), Reuter et al.
patent: 2004/0251501 (2004-12-01), Catalasan et al.
patent: 2005/0028125 (2005-02-01), Watanabe et al.
patent: 2005/0138592 (2005-06-01), Morgan et al.
patent: 2006/0031805 (2006-02-01), Fassnacht et al.
Chiang Jack
Greenblum & Bernstein P.L.C.
Parihar Suchin
Simmons Ryan
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