4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Henry A. Bonges, III

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BiCMOS output driver

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Cloned and original circuit shape merging

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method of assessing potential for charging damage in SOI...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate

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Method of assessing potential for charging damage in SOI...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method of performing latch up check on an integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1071623

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