4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Ryan Simmons

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Method for estimating aggregate leakage of transistors

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Segmented algorithmic pattern generator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method to improve chip yield, reliability and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3112563

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