Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-12
2006-12-12
Brewster, William M. (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S218000, C438S257000, C438S691000
Reexamination Certificate
active
07148098
ABSTRACT:
A method for forming a split-gate flash memory structure includes etching a first gate layer to form one or more floating gates and forming an isolation layer over the floating gates. An insulation layer is deposited over the isolation layer and planarized.
REFERENCES:
patent: 2001/0012662 (2001-08-01), Hsieh et al.
patent: 2003/0073276 (2003-04-01), Lin et al.
Stanley Wolf Ph.D. in Silicon Processing for the VLSI Era, vol. 2: Process Integration, Lattice Press, 1990, p. 194.
Rebecca Mih et al., “0.18 um Modular Triple Self-Aligned Embedded Split-gate Flash Memory”, 2000 Symposium on VLSI Technology Digest of Technical Papers, pp. 120-121.
Chen Jiun Nan
Huang Shieh Feng
Tsai Lien Yo
Brewster William M.
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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