System and method for testing video devices using a test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S729000

Reexamination Certificate

active

06961885

ABSTRACT:
Systems and methods are provided for testing a device. A test fixture is provided for interfacing a device with a host system for generating tests to be run on the device. The device is placed in a scan-test mode, according to a built-in self-test of the device. A scan clock signal and scan pattern are provided to allow scan-tests to be run on the device. If the device passes the scan test, the device is placed in a real-time test mode. At-speed tests may then be run on the device to provide a robust test and identify portions of the device that may be faulty.

REFERENCES:
patent: 4504783 (1985-03-01), Zasio et al.
patent: 4760330 (1988-07-01), Lias, Jr.
patent: 5477544 (1995-12-01), Botelho
patent: 5969756 (1999-10-01), Buckley et al.
patent: 6128757 (2000-10-01), Yousuf et al.
patent: 6294908 (2001-09-01), Belmore et al.
patent: 6357026 (2002-03-01), Hoang et al.
patent: 6421798 (2002-07-01), Lin et al.
patent: 6480978 (2002-11-01), Roy et al.
patent: 6539510 (2003-03-01), St. Pierre et al.
patent: 6559671 (2003-05-01), Miller et al.
patent: 6678850 (2004-01-01), Roy et al.
patent: 6691270 (2004-02-01), Blasco Allue et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for testing video devices using a test... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for testing video devices using a test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for testing video devices using a test... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3502202

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.