Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-01-04
2011-01-04
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S025000, C714S030000, C714S031000, C714S032000, C714S043000, C714S045000, C714S056000, C714S741000, C714S048000, C714S716000, C714S717000, C714S712000, C714S709000, C714S715000, C714S726000, C714S728000, C714S733000, C714S738000, C714S739000, C714S718000, C702S108000, C702S118000, C703S014000, C703S015000, C703S021000, C703S022000, C365S201000
Reexamination Certificate
active
07865789
ABSTRACT:
A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.
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Bueti Serafino
Courchesne Adam
Goodnow Kenneth J.
Mann Gregory J.
Norman Jason M.
International Business Machines - Corporation
McGinn Intellectual Property Law Group PLLC
Trimmings John P
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