System and method for device performance characterization in...

Details System and method for device performance characterization in... System and method for device performance characterization in...

2011-08-23

2011-08-23

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000

Reexamination Certificate

active

08006149

ABSTRACT:
A method for data logging from inside a semiconductor device, yielding timing performance information about the logic behind each and every flip-flop in the scan chain and displaying the sensitivity of certain flipflops to speed related manufacturing defects. The method comprises steps for testing, measuring, storing, and analyzing records for frequency characterization of complex digital semiconductors.

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patent: 06051031 (1994-02-01), None

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