Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1989-10-18
1992-08-18
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430309, 430315, 430945, G03C 500, G03F 700
Patent
active
051399253
ABSTRACT:
A resist exposed to patterned radiation at 193 nm forms a highly crosslinked barrier layer in the exposed regions of the resist surface. The complementary surface regions are silylated in a silicon-containing reagent, and the exposed regions are readily removed by a oxygen RIE plasma. The laser exposure is a reciprocal process allowing precise control. Pattern definition is enhanced by limiting the exposure and the silylation to the surface of the resist.
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Visser et al, "Mechanism and Kinetics of Silylation of Resist Layers from the Gas Phase", Proceedings of SPIE, vol. 771 (1987), pp. 1-7.
Bowers Jr. Charles L.
Engellenner Thomas J.
Falkoff Michael I.
Massachusetts Institute of Technology
Young Christopher G.
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